The HD-2700 is a 200 kV, C_s-corrected (meaning spherical aberration is nullified) dedicated Scanning Transmission Electron Microscope (STEM) with a cold field emission source.  It has Brightfield and HAADF detectors as well as a Secondary Electron detector, which enables atomic-resolution SEM imaging.  It also has a Bruker EDS detector for elemental analysis, and standard, single-tilt, bulk sample, and chip heating (~1000 °C) holders.

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