Feel free to contact us with any questions about imaging or analyzing your sample. Even if what you want to do is not listed on our site, we may have recommendations for whom or where to ask next. See the list below for who could answer your question.
Electron Microscopy:
Yolande Berta | SEM, CL, TEM and EDS
Yong Ding | Hi-Res TEM
Mengkun Tian | STEM and FIB
Stephan Turano | EBSD
Todd Walters
Near Surface Phenomena
Rebhadevi “Rathi” Monikandan | AFM, Surface Sci, Optical Spectroscopy and Microscopy
Weston Straka |AFM, Surface Sci, Optical Spectroscopy and Microscopy
Zac Enderson | LT-SPM, Surface Science
XRD, XRF, EXAFS:
David Tavakoli
Walter Henderson
Organic & Polymer Analysis:
Mechanical Property Testing:
If you have a general question about the MCF, please contact Walter Henderson.