The instrumentation in the MCF can analyze samples in multiple different ways from the macro to atomic levels. The tools in the MCF can be sorted by their ability to do one or more of the three basic measurements:
- Microscopy: Magnifying the physical features of a sample up to >10 million times to determine features sizes, shapes and structure
- Spectroscopy: Sorting the particles or radiation emitted from a sample by energy or mass, usually to determine its composition
- Diffraction: Sorting the particles or radiation emitted from a sample by position or direction usually to determine structure
Microscopy
Spectroscopy
Diffraction
Sample prep capabilities
MCF staff can assist users in preparing samples for any of the above techniques. The following techniques are available:
- carbon evaporation (Quorum Q-150 T ES)
- gold / palladium sputter coating (Quorum Q-150 & Hummer V sputterers)
- UV / ozone cleaning (SEM & TEM: Hitachi ZoneSEM)
- Plasma cleaning
- Ion polishing
- Ion milling
- vacuum oven (drying / driving off solvent)
- IR heat lamp (sample outgassing / adhesive curing)
MCF provides some types of SEM sample stubs and adhesive materials (e.g. carbon dots, carbon tape, copper tape, colloidal graphite / carbon paint, silver paint, high-temperature nickel paste, etc).